There exist several types of optical solutions that illustrate the thickness of a thin film and thick coating thickness. They're conjointly useful in learning the surface and interface behavior of a thin-film. A film's optical properties like refractive index that is denoted by letter N and extinction constant i.e. K can even be explained by this result. The concentrations of an alloy and its consistency are determined with the assistance of solutions provided. For those who are searching for film gauge thickness measurement equipments and want to measure thin-film, they can select these devices for this purpose. Such devices permit to record film thickness and ratio up to five layers thick. The tools are very simple to rearrange and management as Windows primarily based package is employed in it that is known by most of the folks. And this makes the interface of those equipments like the software.

The film thickness gauge measures the dimension of a spread of geometrical substances up to 300mm in diameter. It conjointly computes varied varieties of mapping patterns like polar, linear, sq. and random coordinates. It’s a detector system tool that accelerates the film thickness measure method. The tool with advanced optics is intended in a very means that it greatly contributes in enhancing its system performance.

To study the optical properties of a thin film, a tool named Microspectrophotometer is widely used. Same properties are studied for thick coatings over a micrometer region. This device is also known as microreflectometer, micro-reflectometer, microspectrometer, microphotometer (Spectroscopic), microspectroscopic photometer etc.

A  UV ray visible photometer is employed because it covers from DUV to infrared ranges. The choice of vary depends on many factors like thickness of thin film, thick coating and acceptable wavelength vary for reflection factor or coefficient.

This UV ray visible photometer is straightforward to work because it conjointly has Window primarily based package. It's convenient to use setup and tiny table high style makes it most preferred and it will increase its performance. This equipment permits getting reflection, transmission and absorption spectra in milliseconds. It’s conjointly appropriate to use for real time spectra and ratio management. The system comes with complete optical constants information and library for its user.

Other than this, it's an integrated vision, spectrum and simulation system. Additionally, it's equipped with latest imaging package that calculates angle, distance, space and particle count.

At SemiconSoft, Inc. we are expertise in building low cost, reliable and straightforward techniques in order to use instruments to measure thin-film. SemiconSoft, Inc. is that the producer of Plasma Monitor system and TFCompanion code - the actual code for thin-film analysis.

Our techniques are Non-destructive techniques therefore may be designed to address coatings, linings and measure thin-film. Our devices are easy-to-use, cheap, and backed with unrivaled support. You can get more details about instruments and our services on  main website www.semiconsoft.com